[PDF.07hw] Through-Silicon Vias for 3D Integration
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Through-Silicon Vias for 3D Integration
Dr John H. Lau
[PDF.ft07] Through-Silicon Vias for 3D Integration
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| #2166543 in Books | McGraw-Hill Professional | 2012-10-11 | Original language:English | PDF # 1 | 9.30 x.90 x6.30l,1.50 | File type: PDF | 512 pages | ||About the Author||John H. Lau, Ph.D., P.E., IEEE Fellow, ASME Fellow, ITRI Fellow, spent 30 years in the electronics industry (HP and Agilent) in Palo Alto, California, and currently serves as a fellow at the Electronics & Optoelectronics Laboratories, In
A comprehensive guide to TSV and other enabling technologies for 3D integration
Written by an expert with more than 30 years of experience in the electronics industry, Through-Silicon Vias for 3D Integration provides cutting-edge information on TSV, wafer thinning, thin-wafer handling, microbumping and assembly, and thermal management technologies. Applications to highperformance, high-density, low-power-consumption, wide-bandwidth, and small-form-fac...
You easily download any file type for your gadget.Through-Silicon Vias for 3D Integration | Dr John H. Lau. I really enjoyed this book and have already told so many people about it!