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Thermal Testing of Integrated Circuits
J. Altet, Antonio Rubio
[PDF.lj85] Thermal Testing of Integrated Circuits
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| #15366085 in Books | J Altet | 2011-09-21 | 2011-09-21 | Original language:English | PDF # 1 | 9.25 x.51 x6.10l,.71 | File type: PDF | 204 pages | Thermal Testing of Integrated Circuits|
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
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