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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Way Kuo, Wei-Ting Kary Chien, Taeho Kim
[PDF.er66] Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
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| #4067606 in Books | Way Kuo | 1998-01-31 | Original language:English | PDF # 1 | 9.21 x1.00 x6.14l,1.62 | File type: PDF | 394 pages | Reliability Yield And Stress Burn In|
The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found ...
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