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Reliability Prediction from Burn-In Data Fit to Reliability Models
Joseph Bernstein
[PDF.cr96] Reliability Prediction from Burn-In Data Fit to Reliability Models
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| #3248057 in Books | Bernstein Joseph | 2014-03-24 | Original language:English | PDF # 1 | 9.02 x.22 x5.98l,.0 | File type: PDF | 108 pages | Reliability Prediction from Burn In Data Fit to Reliability Models||From the Back Cover||This work will educate chip and system designers in a method for accurately predicting circuit and system reliability in order to estimate failures that will occur as a function of operating conditions at the chip level. Currently, chip supp
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently pe...
You can specify the type of files you want, for your device.Reliability Prediction from Burn-In Data Fit to Reliability Models | Joseph Bernstein. A good, fresh read, highly recommended.