[PDF.90wl] Materials Characterization Using Nondestructive Evaluation (NDE) Methods (Woodhead Publishing Series in Electronic and Optical Materials)
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Materials Characterization Using Nondestructive Evaluation (NDE) Methods (Woodhead Publishing Series in Electronic and Optical Materials)
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| #2669420 in Books | Ingramcontent | 2016-04-19 | Original language:English | PDF # 1 | 9.02 x.75 x5.98l,1.33 | File type: PDF | 320 pages | Materials Characterization Using Nondestructive Evaluation Nde Methods Woodhead Publishing Series in Electronic and Optical Materials||About the Author|Dr. Gerhard Hübschen worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, in the department for “Materials characterization, defect detection and lifetime management
Dr. Ir
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques...
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