[PDF.28eg] Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
From Lawrence C Wagner
[PDF.pa18] Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
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| #4466493 in Books | Lawrence C Wagner | 1999-01-31 | Original language:English | PDF # 1 | 9.21 x.75 x6.14l,1.30 | File type: PDF | 255 pages | Failure Analysis of Integrated Circuits Tools and Techniques|
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
You easily download any file type for your device.Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science) | From Lawrence C Wagner. I really enjoyed this book and have already told so many people about it!