[PDF.32fj] Electromigration and Electronic Device Degradation
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Electromigration and Electronic Device Degradation
From Aris Christou
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| #7931664 in Books | Aris Christou | 1993-12 | Original language:English | PDF # 1 | 9.45 x.79 x6.30l,1.51 | File type: PDF | 343 pages | Electromigration and Electronic Device Degradation||From the Publisher|Addresses electromigration failure modes in electronics covering both theory and experiments. s silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes wit
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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